» ISO 14001认证

[Japan]

Certified Laboratory	Applicable accerdiation criteria	Initial accrediation	Certificate of accrediation
NDK Quality Assurance Laboratory	ISO/IEC 17025:2005	Feb. 4, 2008	ISO/IEC 17025:2005
	Scope of accreditation
	M21  Electrical testing  M21.5  Environmental testing  M21.5.1  Temperature tests  M21.5.1.1  Cold tests  JIS C 60068-2-1, IEC 60068-2-1:1990 + A1:1993 + A2:1994  Test Aa (except 6, 8, 10)  Test temperature : -40°C  M21.5.1.2  Dry heat tests  JIS C 60068-2-2, IEC 60068-2-2:1974 + A1:1993  Test Ba (except 6, 8, 10)  Test temperature : 85°C, 100°C, 125°C, 155°C, 175°C  M21.5.2  Temperature change tests  M21.5.2.2  Thermal shock tests  JIS C 0025 Test Na (except 2.5, 2.8)  IEC 60068-2-14 Test Na (except 1.5, 1.8)  Test temperature : -40°C, 85°C, 100°C, 125°C, 155°C  M21.5.3  Humidity tests  M21.5.3.1  Damp heat tests, steady state  JIS C 60068-2-78 (except 6, 8, 10)  IEC 60068-2-78 (except 6, 8, 10)  Test combination : 40±2°C and 93±3%RH    (*) We do not accept requests for consignment testing.

Certified Plant	Type of Certification	Certification Date	Register Certificate / Scope of Registration
NDK Sayama Plant	ISO 9001:2000	Feb. 14, 2003	ISO 9001:2000 ISO 9001:2000 Design, Development & Manufacture of Optical Components (DRP, QWP, Prism), Crystal Units, Crystal Oscillators, Crystal Filters, Ultrasonic Transducers, Synthetic Quartz and Synthesizer. Design & Development of SAW Devices. (*) NDK's Head Office & Sayama Plant remotely support to certify ISO/TS 16949 at our subsidiaries.
Furukawa NDK	ISO/TS 16949:2002	Feb. 10, 2005	ISO/TS 16949:2002 ISO 9001:2000 ISO/TS 16949:2002 Design, Development & Manufacture of Crystal Units (PF, CSY), Crystal Oscillator (COD) & Crystal Wafers as Materrial of Crystal Units (PF, CSY), Crystal Oscillator (COD) for Automotive Use ISO 9001:2000 Manufacture of Crystal Blanks, Crystal Units & Crystal Oscillators (*) Remote Supporting Functions : Nihon Dempa Kogyo Co., Ltd. Head Office / Sayama Plant, NDK America, Inc., NDK Europe Ltd., NDK France Sarl
	ISO 9001:2000	Feb. 14, 2003
Hakodate NDK	ISO/TS 16949:2002	Feb. 03, 2006	ISO/TS 16949:2002 ISO 9001:2000 ISO/TS 16949:2002 Design, Development & Manufacture of Crystal Units (CST) & Crystal Oscillators (XAC) for Automotive Use ISO 9001:2000 Manufacture of Crystal Units, Crystal Oscillators & SAW Devices (*) Remote Supporting Functions : Nihon Dempa Kogyo Co., Ltd. Head Office / Sayama Plant, NDK America, Inc., NDK Europe Ltd., NDK France Sarl
	ISO 9001:2000	Feb. 14, 2003
Niigata NDK	ISO/TS 16949:2002	Feb. 02, 2007	ISO/TS 16949:2002 ISO 9001:2000 ISO/TS 16949:2002 Design, Development & Manufacture of Crystal Units (CSB) for Automotive Use ISO 9001:2000 Manufacture of Crystal Units, Crystal Filters & Crystal Oscillators (*) Remote Supporting Functions : Nihon Dempa Kogyo Co., Ltd. Head Office / Sayama Plant
	ISO 9001:2000	Feb. 02, 2007

[Asia]

Certified Plant	Type of Certification	Certification Date	Register Certificate / Scope of Registration
ANC / NQM	ISO/TS 16949:2002	Dec. 05, 2005	ISO/TS 16949:2002 ISO 9001:2000 ISO/TS 16949:2002 Design & Manufacture of Crystal Units & Monolithic Crystal Filters ISO 9001:2000 Design & Manufacture of Crystal Units & Monolithic Crystal Filters (*) Remote Supporting Functions : Nihon Dempa Kogyo Co., Ltd. Head Office / Sayama Plant, NDK America, Inc., NDK Europe Ltd., NDK France Sarl
	ISO 9001:2000	Nov. 20, 2002
Suzhou NDK	ISO/TS 16949:2002	Nov. 04, 2005	ISO/TS 16949:2002 ISO 9001:2000 ISO/TS 16949:2002 Design & Manufacture of Crystal Units (PF, LP, NR-18, CSF, CSJ, CSE, CSU, CSK) ISO 9001:2000 Design & Manufacture of Crystal Units, Crystal Oscillators & Optical Components (*) Remote Supporting Functions : Nihon Dempa Kogyo Co., Ltd. Sayama Plant
	ISO 9001:2000	Apr. 25, 2002

[America]

Certified Plant	Type of Certification	Certification Date	Register Certificate / Scope of Registration
NDK America	ISO 9001:2000	Jul. 28, 2005	ISO 9001:2000 ISO 9001:2000 Design, Development & Disribution of Crystal Products

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