English Sitetop > About Us > ISO/IEC 17025 // ISO 9001 // ISO/TS 16949 Certification

ISO

» Obtainment of ISO 14001 Certification

[Japan]

Certified
Laboratory		 Applicable
accerdiation criteria		 Initial
accrediation		 Certificate
of accrediation
NDK Quality Assurance Laboratory ISO/IEC 17025:2005 Feb. 04, 2008
ISO/IEC 17025:2005
ISO/IEC 17025:2005
Scope of accreditation
 M21 Electrical testing
 M21.5 Environmental testing
 M21.5.1 Temperature tests
 M21.5.1.1 Cold tests
 JIS C 60068-2-1:1995, IEC 60068-2-1:1990 + A1:1993 + A2:1994
 Test Aa (except 6, 8, 10)
 Test temperature : -40°C
 M21.5.1.2 Dry heat tests
 JIS C 60068-2-2:1995, IEC 60068-2-2:1974 + A1:1993
 Test Ba (except 6, 8, 10)
 Test temperature : 85°C, 100°C, 125°C, 155°C, 175°C
 M21.5.2 Temperature change tests
 M21.5.2.2 Thermal shock tests
 JIS C 0025 Test Na (except 2.5, 2.8)
 IEC 60068-2-14 Test Na (except 1.5, 1.8)
 Test temperature : -40°C, 85°C, 100°C, 125°C, 155°C
 M21.5.3 Humidity tests
 M21.5.3.1 Damp heat tests, steady state
 JIS C 60068-2-78 (except 6, 8, 10)
 IEC 60068-2-78 (except 6, 8, 10)
 Test combination : 40±2°C and 93±3%RH
 
 (*) We do not accept requests for consignment testing.

Certified Plant Type of Certification Certification Date Register Certificate /
Scope of Registration
NDK ISO 9001:2008 Dec. 3, 2010
ISO 9001:2008
ISO 9001:2008
ISO 9001:2008
Design, Development & Manufacture of Optical Components (DRP, QWP, Prism), Crystal Units, Crystal Oscillators, Crystal Filters, Ultrasonic Transducers, Synthetic Quartz and Synthesizer.
Design & Development of SAW Devices.

(*) NDK's Head Office & Sayama Plant remotely support to certify ISO/TS 16949 at our subsidiaries.
Furukawa NDK ISO/TS 16949:2009 Jan. 15, 2010
ISO/TS 16949:2009
ISO/TS 16949:2009
ISO 9001:2008
ISO 9001:2008
ISO/TS 16949:2009
Design, Development & Manufacture of Crystal Units (CSY, CRS/CSR, MUS), Crystal Oscillator (COD) & Crystal Wafers as Materrial of Crystal Units (CSY, CRS/CSR), Crystal Oscillator (COD) for Automotive Use

(*) Remote Supporting Functions :
Nihon Dempa Kogyo Co., Ltd. Head Office / Sayama Plant, NDK America, Inc., NDK Europe Ltd., NDK Europe Ltd. French Office, NDK Italy Srl, Frischer Electronic GmbH

ISO 9001:2008
Manufacture of Crystal Blanks, Crystal Units, Crystal Oscillators & Optical Parts

(*) Associated Organization :
Furukawa NDK Co., Ltd. Second Factory
ISO 9001:2008 Jan. 15, 2010
Hakodate NDK ISO/TS 16949:2009 Dec. 24, 2010
ISO/TS 16949:2009
ISO/TS 16949:2009
ISO 9001:2008
ISO 9001:2008
ISO/TS 16949:2009
Design, Development & Manufacture of Crystal Units (CST, CSG) & Crystal Oscillators (XAC)

(*) Remote Supporting Functions :
Nihon Dempa Kogyo Co., Ltd. Head Office / Sayama Plant, NDK America, Inc., NDK Itaky Srl, NDK Europe Ltd. French Office, NDK Electronics Shanghai Co., Ltd., FRG Frischer Electronics Gmbh

ISO 9001:2008
Manufacture of Crystal Units, Crystal Oscillators & SAW Devices
ISO 9001:2008 Dec. 24, 2010
Niigata NDK ISO/TS 16949:2009 Jan. 29, 2010
ISO/TS 16949:2009
ISO/TS 16949:2009
ISO 9001:2008
ISO 9001:2008
ISO/TS 16949:2009
Design, Development & Manufacture of Crystal Units (CSB, CSE) for Automotive Use

(*) Remote Supporting Functions :
Nihon Dempa Kogyo Co., Ltd. Head Office / Sayama Plant, NDK America, Inc., NDK Europe Ltd., NDK Europe Ltd. French Office, NDK Italy Srl, Frischer Electronic GmbH

ISO 9001:2008
Manufacture of Crystal Units, Crystal Filters & Crystal Oscillators
ISO 9001:2008 Feb. 02, 2010

[Asia]

Certified Plant Type of Certification Certification Date Register Certificate /
Scope of Registration
ANC / NQM ISO/TS 16949:2009 Nov. 29, 2010
ISO/TS 16949:2009
ISO/TS 16949:2009
ISO 9001:2008
ISO 9001:2008
ISO/TS 16949:2009
Design & Manufacture of Crystal Units & Monolithic Crystal Filters

(*) Remote Supporting Functions :
Nihon Dempa Kogyo Co., Ltd. Head Office / Sayama Plant, NDK America Inc., NDK Italy Srl, NDK Europe Ltd., NDK Europe Ltd. French Office, NDK Electronics Shanghai Co., Ltd., FRG Frischer Electronics Gmbh

ISO 9001:2008
Design & Manufacture of Crystal Units & Monolithic Crystal Filters
ISO 9001:2008 Nov. 29, 2010
Suzhou NDK ISO/TS 16949:2009 Apr. 25, 2011
ISO/TS 16949:2009
ISO/TS 16949:2009
ISO 9001:2008
ISO 9001:2008
ISO/TS 16949:2009
Design & Manufacture of Crystal Units

(*) Remote Supporting Functions :
Nihon Dempa Kogyo Co., Ltd. Head Office / Sayama Plant

ISO 9001:2008
Design & Manufacture of Crystal Units, Crystal Oscillators & Optical Components
ISO 9001:2008 Apr. 25, 2011

[America]

Certified Plant Type of Certification Certification Date Register Certificate /
Scope of Registration
NDK America ISO 9001:2008 Apr. 22, 2011
ISO 9001:2008
ISO 9001:2008
ISO 9001:2008
Design, Development & Disribution of Crystal Products

[References] Previous Certification

Certified Plant Type of Certification Certification Date Note
NDK Sayama Plant ISO 9001:2000 Feb. 14, 2003 The sites inclueded in the scope og registration : Head Office, Saszuka Taiyo Office, Chitose Technical Center, Kansai Salles Office & Chubu Sales Office
QS-9000 Apr. 10, 1998 The remote location whithin the scope og registration : Furukawa NDK & Hakodate NDK
ISO 9001:1994 Dec. 12, 1994 The sites inclueded in the scope og registration : Furukawa NDK, Hakodate NDK & Niigata NDK
Furukawa NDK ISO/TS 16949:2002 Feb. 10, 2005  
ISO 9001:2000 Feb. 14, 2003  
Hakodate NDK ISO/TS 16949:2002 Feb. 03, 2006  
ISO 9001:2000 Feb. 14, 2003  
Niigata NDK ISO/TS 16949:2002 Feb. 02, 2007  
ISO 9001:2000 Feb. 02, 2007  
ANC / NQM ISO/TS 16949:2002 Dec. 13, 2005  
ISO 9001:2000 Nov. 20, 2002  
QS-9000 Nov. 20, 1998  
ISO 9002:1994 Nov. 09, 1994 ANC
Aug. 26, 1994 NQM
Suzhou NDK ISO/TS 16949:2002 Nov. 04, 2005  
ISO 9001:2000 Apr. 25, 2002  
QS-9000 Sep. 16, 1998  
ISO 9002:1994 Dec. 01, 1996  
NDK America ISO 9001:2000 Jul. 28, 2005  

 

Copyright© 1997- NIHON DEMPA KOGYO CO., LTD.