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» Obtainment of ISO 14001 Certification

[Japan]

Certified
Laboratory
Applicable
accerdiation criteria
Initial
accrediation
Certificate
of accrediation
NDK Quality Assurance Laboratory ISO/IEC 17025:2005 Feb. 04, 2008
ISO/IEC 17025:2005
ISO/IEC 17025:2005
Scope of accreditation
 M21 Electrical testing
 M21.5 Environmental testing
 M21.5.1 Cold tests
JIS C 60068-2-1:1995, IEC 60068-2-1:1990 + A1:1993 + A2:1994
Test Aa(except 6, 8, 10)
Test temperature: -40 °C
 M21.5.2 Dry heat tests
JIS C 60068-2-2:O191995, IEC 60068-2-2:1974 + A1:1993
Test Ba(except 6, 8, 10)
Test temperature: 85 °C, 100 °C, 125 °C, 155 ℃°C, 175°C
 M21.5.4  Thermal shock tests
JIS C 0025:1988
Test Na(except 2.5, 2.8 and except 2.6.2 the exposure time 10 min)
IEC 60068-2-14:1984
Test Na(except 1.5, 1.8 and except 1.6.2 the exposure time 10 min)
Test temperature: -40 °C, 85 °C, 100 °C, 125 °C, 155 ℃
 M21.5.5  Humidity tests
JIS C 60068-2-78:2004(except 6, 8, 10),
IEC 60068-2-78:2001(except 6, 8, 10)
Test combination: 40 °C and 93 %RH
 
 (*) We do not accept requests for consignment testing.

Certified Plant Type of Certification Initial Certification Date Register Certificate /
Scope of Registration
NDK ISO 9001:2015 Dec. 2, 1994 ISO 9001:2015
ISO 9001:2015
Design, Development & Manufacture of Optical Components (DRP, QWP, Prism), Crystal Units, Crystal Oscillators, Crystal Filters, Ultrasonic Transducers, Synthetic Quartz and Synthesizer.
Design & Development of SAW Devices.

(*) NDK's Head Office & Sayama Plant remotely support to certify IATF 16949 at our subsidiaries.
ISO 13485:2003 Mar. 12, 2014 ISO 13485:2003
ISO 13485:2003
The Design / Development & Manufacture of Diagnostic Ultrasonic Probes
Furukawa NDK IATF16949:2016 Feb. 10, 2005 IATF16949:2016
IATF16949:2016
ISO 9001:2015
ISO 9001:2015
ISO 9001:2015 Feb. 14, 2003 IATF16949:2016
Design and manufacturing of Crystal Blanks, Crystal Units and Crystal Oscillators

(*) Remote Supporting Functions :
Nihon Dempa Kogyo Co., Ltd. Head Office / Sayama Plant, NDK America, Inc., NDK Europe Ltd., NDK Europe Ltd. French Office, Frischer Electronic GmbH NDK Italy Srl, NDK Electronics Shanghai Co., Ltd.

ISO 9001:2015
Manufacturing of Crystal Blanks, Crystal Units and Crystal Oscillators

(*) Associated Organization :
Furukawa NDK Co., Ltd. Second Factory
Hakodate NDK IATF 16949:2016 Feb. 3, 2006 IATF 16949:2016
IATF 16949:2016
ISO 9001:2008
ISO 9001:2015
ISO 9001:2015 Feb. 14, 2003 IATF 16949:2016
Design and manufacturing of Crystal Units (Except for the Tuning-Fork), Crystal Oscillators and SAW Devices.

(*) Remote Supporting Functions :
Nihon Dempa Kogyo Co., Ltd. Head Office / Sayama Plant, NDK America, Inc., NDK Itaky Srl, NDK Europe Ltd. French Office, FRG Frischer Electronics Gmbh, NDK Electronics Shanghai Co., Ltd., NDK Europe Ltd.

ISO 9001:2015
Manufacture of Crystal Units, Crystal Oscillators & SAW Devices
Niigata NDK IATF 16949:2016 Feb. 2, 2007 IATF 16949:2016
IATF 16949:2016
ISO 9001:2015
ISO 9001:2015
ISO 9001:2015 Feb. 2, 2007 IATF 16949:2016
Design and manufacturing of Crystal Units (Except for Lead-Mount Type)

(*) Remote Supporting Functions :
Nihon Dempa Kogyo Co., Ltd. Head Office / Sayama Plant, NDK America, Inc., NDK Europe Ltd., NDK Europe Ltd. French Office, NDK Europe Ltd. Italy Office, Frischer Electronic GmbH, NDK Electronics Shanghai Co., Ltd.

ISO 9001:2015
Manufacture of Crystal Units, Crystal Filters & Crystal Oscillators

[Asia]

Certified Plant Type of Certification Initial Certification Date Register Certificate /
Scope of Registration
ANC/NQM IATF 16949:2016 Dec. 13, 2005 IATF 16949:2016
 
IATF 16949:2016
IATF 16949:2016
NQM
IATF 16949:2016
ISO 9001:2015
 
ISO 9001:2015
ISO 9001:2015 Nov. 20, 2002 IATF 16949:2016
(ANC)
Design & Manufacture of Crystal Units & Monolithic Crystal Filters
(NQM)
Design & Manufacture of AT-Cut Crystal Blanks

(*) Remote Supporting Functions :
(ANC)
Nihon Dempa Kogyo Co., Ltd. Head Office / Sayama Plant, NDK America Inc., NDK Italy Srl, NDK Europe Ltd., NDK Europe Ltd. French Office, NDK Electronics Shanghai Co., Ltd., FRG Frischer Electronics Gmbh
(NQM)
Asian NDK Crystal Sdn. Bhd., Nihon Dempa Kogyo Co., Ltd. Sayama Plant

ISO 9001:2015
Design & Manufacture of Crystal Units & Monolithic Crystal Filters
Suzhou NDK IATF 16949:2016 Nov. 4, 2005 IATF 16949:2016
IATF 16949:2016
  ISO 9001:2015
ISO 9001:2015
ISO 9001:2015 Apr. 25, 2002 IATF 16949:2016
Design & Manufacture of Crystal Units

(*) Remote Supporting Functions :
Nihon Dempa Kogyo Co., Ltd. Head Office / Sayama Plant, NDK Electronics Shanghai Co., Ltd.

ISO 9001:2015
Design & Manufacture of Crystal Units, Crystal Oscillators & Optical Components

[References] Previous Certification

Certified Plant Type of Certification Certification Date Note
NDK Sayama Plant ISO 9001:2000 Feb. 14, 2003 Included in the Associated organization : Head Office, Sasazuka Taiyo Office, Chitose Technical Center, Kansai Sales Office & Chubu Sales Office
QS-9000 Apr. 10, 1998 Included in the Associated organization : Furukawa NDK & Hakodate NDK
ISO 9001:1994 Dec. 12, 1994 Included in the Associated organization : Furukawa NDK, Hakodate NDK & Niigata NDK
ISO 13485:2003 Nov. 24, 2017 Changed third party review agency
Furukawa NDK ISO/TS 16949:2002 Feb. 10, 2005  
ISO 9001:2000 Feb. 14, 2003  
Hakodate NDK ISO/TS 16949:2002 Feb. 03, 2006  
ISO 9001:2000 Feb. 14, 2003  
Niigata NDK ISO/TS 16949:2002 Feb. 02, 2007  
ISO 9001:2000 Feb. 02, 2007  
ANC / NQM ISO/TS 16949:2002 Dec. 13, 2005  
ISO 9001:2000 Nov. 20, 2002  
QS-9000 Nov. 20, 1998  
ISO 9002:1994 Nov. 09, 1994 ANC
Aug. 26, 1994 NQM
Suzhou NDK ISO/TS 16949:2002 Nov. 04, 2005  
ISO 9001:2000 Apr. 25, 2002  
QS-9000 Sep. 16, 1998  
ISO 9002:1994 Dec. 01, 1996  
NDK America ISO 9001:2000 Jul. 28, 2005  
ISO 9001:2008 Apr. 22, 2011  

 

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