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» Obtainment of ISO 14001 Certification

[Japan]

Certified
Laboratory
Applicable
accerdiation criteria
Initial
accrediation
Certificate
of accrediation
NDK Quality Assurance Laboratory ISO/IEC 17025:2005 Feb. 04, 2008
ISO/IEC 17025:2005
ISO/IEC 17025:2005
Scope of accreditation
 M21 Electrical testing
 M21.5 Environmental testing
 M21.5.1 Cold tests
JIS C 60068-2-1:1995, IEC 60068-2-1:1990 + A1:1993 + A2:1994
Test Aa(except 6, 8, 10)
Test temperature: -40 °C
 M21.5.2 Dry heat tests
JIS C 60068-2-2:O191995, IEC 60068-2-2:1974 + A1:1993
Test Ba(except 6, 8, 10)
Test temperature: 85 °C, 100 °C, 125 °C, 155 ℃°C, 175°C
 M21.5.4  Thermal shock tests
JIS C 0025:1988
Test Na(except 2.5, 2.8 and except 2.6.2 the exposure time 10 min)
IEC 60068-2-14:1984
Test Na(except 1.5, 1.8 and except 1.6.2 the exposure time 10 min)
Test temperature: -40 °C, 85 °C, 100 °C, 125 °C, 155 ℃
 M21.5.5  Humidity tests
JIS C 60068-2-78:2004(except 6, 8, 10),
IEC 60068-2-78:2001(except 6, 8, 10)
Test combination: 40 °C and 93 %RH
 
 (*) We do not accept requests for consignment testing.

Certified Plant Type of Certification Certification Date Register Certificate /
Scope of Registration
NDK ISO 9001:2008 Dec. 3, 2010
ISO 9001:2008
ISO 9001:2008
ISO 9001:2008
Design, Development & Manufacture of Optical Components (DRP, QWP, Prism), Crystal Units, Crystal Oscillators, Crystal Filters, Ultrasonic Transducers, Synthetic Quartz and Synthesizer.
Design & Development of SAW Devices.

(*) NDK's Head Office & Sayama Plant remotely support to certify ISO/TS 16949 at our subsidiaries.
ISO 13485:2003 Mar. 12, 2014
ISO 9001:2008
ISO 13485:2003
Design, Development & Manufacture of Ultrasonic Probes
Furukawa NDK ISO/TS 16949:2009 Jan. 15, 2010
ISO/TS 16949:2009
ISO/TS 16949:2009
ISO 9001:2008
ISO 9001:2008
ISO/TS 16949:2009
Design and manufacturing of Crystal Blanks, Crystal Units and Crystal Oscillators

(*) Remote Supporting Functions :
Nihon Dempa Kogyo Co., Ltd. Head Office / Sayama Plant, NDK America, Inc., NDK Europe Ltd., NDK Europe Ltd. French Office, Frischer Electronic GmbH NDK Italy Srl, NDK Electronics Shanghai Co., Ltd.


ISO 9001:2008
Manufacturing of Crystal Blanks, Crystal Units and Crystal Oscillators

(*) Associated Organization :
Furukawa NDK Co., Ltd. Second Factory
ISO 9001:2008 Jan. 15, 2010
Hakodate NDK ISO/TS 16949:2009 Dec. 24, 2010
ISO/TS 16949:2009
ISO/TS 16949:2009
ISO 9001:2008
ISO 9001:2008
ISO/TS 16949:2009
Design and manufacturing of Crystal Units (Except for the Tuning-Fork), Crystal Oscillators and SAW Devices.

(*) Remote Supporting Functions :
Nihon Dempa Kogyo Co., Ltd. Head Office / Sayama Plant, NDK America, Inc., NDK Itaky Srl, NDK Europe Ltd. French Office, FRG Frischer Electronics Gmbh, NDK Electronics Shanghai Co., Ltd., NDK Europe Ltd.

ISO 9001:2008
Manufacture of Crystal Units, Crystal Oscillators & SAW Devices
ISO 9001:2008 Dec. 24, 2010
Niigata NDK ISO/TS 16949:2009 Jan. 29, 2010
ISO/TS 16949:2009
ISO/TS 16949:2009
ISO 9001:2008
ISO 9001:2008
ISO/TS 16949:2009
Design and manufacturing of Crystal Units (Except for Lead-Mount Type)

(*) Remote Supporting Functions :
Nihon Dempa Kogyo Co., Ltd. Head Office / Sayama Plant, NDK America, Inc., NDK Europe Ltd., NDK Europe Ltd. French Office, NDK Italy Srl, Frischer Electronic GmbH, NDK Electronics Shanghai Co., Ltd.

ISO 9001:2008
Manufacture of Crystal Units, Crystal Filters & Crystal Oscillators
ISO 9001:2008 Feb. 02, 2010

[Asia]

Certified Plant Type of Certification Certification Date Register Certificate /
Scope of Registration
ANC / NQM ISO/TS 16949:2009 Nov. 29, 2010
ISO/TS 16949:2009ISO/TS 16949:2009
ISO/TS 16949:2009
ISO 9001:2008
ISO 9001:2008
ISO/TS 16949:2009
(ANC)
Design & Manufacture of Crystal Units & Monolithic Crystal Filters
(NQM)
Design & Manufacture of AT-Cut Crystal Blanks

(*) Remote Supporting Functions :
(ANC)
Nihon Dempa Kogyo Co., Ltd. Head Office / Sayama Plant, NDK America Inc., NDK Italy Srl, NDK Europe Ltd., NDK Europe Ltd. French Office, NDK Electronics Shanghai Co., Ltd., FRG Frischer Electronics Gmbh
(NQM)
Asian NDK Crystal Sdn. Bhd., Nihon Dempa Kogyo Co., Ltd. Sayama Plant

ISO 9001:2008
Design & Manufacture of Crystal Units & Monolithic Crystal Filters
ISO 9001:2008 Nov. 29, 2010
Suzhou NDK ISO/TS 16949:2009 Apr. 25, 2011
ISO/TS 16949:2009
ISO/TS 16949:2009
ISO 9001:2008
ISO 9001:2008
ISO/TS 16949:2009
Design & Manufacture of Crystal Units

(*) Remote Supporting Functions :
Nihon Dempa Kogyo Co., Ltd. Head Office / Sayama Plant, NDK Electronics Shanghai Co., Ltd.

ISO 9001:2008
Design & Manufacture of Crystal Units, Crystal Oscillators & Optical Components
ISO 9001:2008 Apr. 25, 2011

[America]

Certified Plant Type of Certification Certification Date Register Certificate /
Scope of Registration
NDK America ISO 9001:2008 Apr. 22, 2011
ISO 9001:2008
ISO 9001:2008
ISO 9001:2008
Design, Development & Distribution of Crystal Products

[References] Previous Certification

Certified Plant Type of Certification Certification Date Note
NDK Sayama Plant ISO 9001:2000 Feb. 14, 2003 Included in the Associated organization : Head Office, Sasazuka Taiyo Office, Chitose Technical Center, Kansai Sales Office & Chubu Sales Office
QS-9000 Apr. 10, 1998 Included in the Associated organization : Furukawa NDK & Hakodate NDK
ISO 9001:1994 Dec. 12, 1994 Included in the Associated organization : Furukawa NDK, Hakodate NDK & Niigata NDK
Furukawa NDK ISO/TS 16949:2002 Feb. 10, 2005  
ISO 9001:2000 Feb. 14, 2003  
Hakodate NDK ISO/TS 16949:2002 Feb. 03, 2006  
ISO 9001:2000 Feb. 14, 2003  
Niigata NDK ISO/TS 16949:2002 Feb. 02, 2007  
ISO 9001:2000 Feb. 02, 2007  
ANC / NQM ISO/TS 16949:2002 Dec. 13, 2005  
ISO 9001:2000 Nov. 20, 2002  
QS-9000 Nov. 20, 1998  
ISO 9002:1994 Nov. 09, 1994 ANC
Aug. 26, 1994 NQM
Suzhou NDK ISO/TS 16949:2002 Nov. 04, 2005  
ISO 9001:2000 Apr. 25, 2002  
QS-9000 Sep. 16, 1998  
ISO 9002:1994 Dec. 01, 1996  
NDK America ISO 9001:2000 Jul. 28, 2005  

 

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