Optical Component
NDK Quality

In-house Manufacturing from Materials

We grow our own synthetic quartz crystals used as birefringent materials.
We grow a variety of synthetic quartz crystals suitable for optical components. One of these is a lineup of optical components using "N-Grade EX," a synthetic quartz crystal of the highest purity with greatly reduced impurities and excellent resistance for high power lasers.

In-house Manufacturing from Materials

Synthetic Quartz Crystal Grade

Grade Inclusion Density1)
(JIS Standard)
Q3585Value2)
(JIS Standard)
Impurities(ppb) Reference Value3) Operating Temperature4)
Al Na Ca Fe Li
n-Grade EX Ⅰa Aa 19 <2 <1 <1 5 573 max
n-Grade Ⅰa A 70 60 <40 <40 <40 573 max
Laser Ⅰa C 2700 1100 140 40 800 573 max
Synthetic Quartz Crystal for Optical Componet Ⅰa - - - - - - 573 max

Remarks)

  1. 1)The foreign matter density complies with JIS-C 6704. Ia grade is the product with the fewest optical inclusions.
  2. 2)The infrared absorption coefficient a value complies with JIS-C 6704. Standardized by the absorption coefficient of hydroxyl group-OH.
  3. 3)This is an example of quantitative analysis by ICP-MS. We do not guarantee the amount of impurities. It is possible to analyze and attach each gemstone upon request, but in that case an analysis fee will be charged separately.
  4. 4)Artificial quartz has a phase transition temperature of 573℃. Please use below this temperature.

See Here for More Information
on Synthetic Quartz Crystals

Automated Visual Inspection

In defect inspections, the use of automatic inspection equipment makes it possible to detect defects as small as 5 μm, leading to improved and more stable delivery quality.

Visibility of Point Defects on Automatic Inspection Equipment

Visibility of Point Defects on Automatic Inspection Equipment

Visibility of Scratch and
Stain Defects on Automatic Inspection Equipment

Visibility of Scratch and Stain Defects on Automatic Inspection Equipment

Resolution Survey Results Using a Reticle

Results of Reticle Confirmation by Automatic Inspection Equipment

Resolution Survey Results Using a Reticle
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